About

Bruker Nano Analytics (BNA) Division, headquartered at Bruker Nano GmbH in Berlin, Germany, develops, manufactures, and markets X-ray systems and components for elemental and structural analysis on the micro and nano scale.

Bruker Nano Analytics' product portfolio includes a unique range of analytical tools for materials characterization in electron microscopes:
• Energy Dispersive Spectrometry on scanning electron microscopes (EDS for SEM)
• Energy Dispersive Spectrometry on transmission electron microscopes (EDS for TEM)
• Electron Backscatter Diffraction analysis (EBSD)
• Wavelength Dispersive Spectrometry for SEM (WDS)
• Micro X-ray Fluorescence analysis on SEM (micro-XRF on SEM)

Besides this unparalleled range of analytical tools for electron microscopes, Bruker also offers a variety of benchtop X-ray fluorescence micro analyzers (micro-XRF) for spatially resolved composition analysis and total reflection X-ray fluorescence (TXRF) instruments for trace element analysis for a multitude of applications in industry and research.

Last but not least, BNA's handheld/mobile/portable X-ray fluorescence spectrometers (handheld XRF) have the capability to non-destructively quantify or qualify nearly any element from magnesium to uranium (depending on specific instrument configurations), delivering fast, on-site elemental analysis in a broad range of application fields.